X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293.15 0.1M sodium hepes pH7.5,15% (w/v) peg 20000
Unit Cell:
a: 37.029 Å b: 95.359 Å c: 115.353 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 2 21 2
Crystal Properties:
Matthew's Coefficient: 3.50 Solvent Content: 64.82
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.05 49.35 26468 1328 99.89 0.2225 0.2468 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.05 49.35 99.9 0.239 ? 19.9 51.3 ? 26537 ? ? 41.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.05 2.11 99.4 ? ? 2.5 42.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-2 0.8731 ESRF ID23-2
Software
Software Name Purpose Version
PHENIX refinement 1.18.2_3874
Aimless data scaling CCP4Interface 7.1.018
XDS data reduction DECEMBER 2003 VERSION
PHASER phasing CCP4Interface 7.1.018
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