X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 291 2 % NaNO3, 0.1 M Na acetate pH 4.5
Unit Cell:
a: 27.250 Å b: 31.930 Å c: 34.270 Å α: 88.52° β: 71.37° γ: 68.16°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.82 Solvent Content: 32.41
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 0.96 21.67 58579 3081 99.8 ? 0.1236 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.96 21.67 99.8 0.121 ? 16.5 6.6 ? 61660 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.96 0.99 99.5 ? ? 4.7 5.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.688 ESRF ID29
Software
Software Name Purpose Version
SHELX refinement .
XSCALE data scaling .
XDS data reduction .
PHENIX phasing .
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