ELECTRON MICROSCOPY

Sample

13pf microtubule bound to Kif5bMoNeIAK in the presence of AMPPNP (two-headed state)

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument LEICA EM GP
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 570836
Reported Resolution (Å) 3.0
Resolution Method FSC 0.143 CUT-OFF
Other Details Relion noise-substitution test corrected FSC
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details Phenix Real Space refine and Coot
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 52
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS KRIOS
Minimum Defocus (nm) 700
Maximum Defocus (nm) 2500
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION RELION 3.0
IMAGE ACQUISITION EPU ?
CTF CORRECTION CTFFIND ?
MODEL REFINEMENT PHENIX ?
FINAL EULER ASSIGNMENT RELION ?
CLASSIFICATION RELION ?
RECONSTRUCTION RELION ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?
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