ELECTRON MICROSCOPY

Sample

NRC2 heler NLR dimer with ADP

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details The C-flat grids were coated with grphene oxide, in house and the sample was applied two times inside the vitrobot chamber
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 229347
Reported Resolution (Å) 3.9
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target CC
Overall B Value 100
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 50
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS KRIOS
Minimum Defocus (nm) 1500
Maximum Defocus (nm) 2700
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 105000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION EPU ?
CTF CORRECTION RELION ?
MODEL FITTING Coot 0.9.6
MODEL FITTING UCSF ChimeraX 1.3
INITIAL EULER ASSIGNMENT RELION ?
CLASSIFICATION RELION 4
RECONSTRUCTION RELION ?
MODEL REFINEMENT PHENIX 1.20.1_4487:
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING ONLY ?