X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 296 1.5 M sodium citrate, 50 mM Tris-HCl (pH 7.5)
Unit Cell:
a: 157.330 Å b: 157.330 Å c: 157.330 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 4 3 2
Crystal Properties:
Matthew's Coefficient: 2.71 Solvent Content: 54.64
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 1.910 78.665 26009 1282 99.985 ? 0.2198 34.238
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.910 78.665 100.0 0.127 ? 44.4 58.3 ? 26027 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 5.185 78.665 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 11.2C 0.9718 ELETTRA 11.2C
Software
Software Name Purpose Version
REFMAC refinement 5.8.0419
XSCALE data scaling .
XDS data reduction .
REFMAC phasing .