X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 293 K | ? |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| FREE ELECTRON LASER | EUROPEAN XFEL BEAMLINE SPB/SFX | 1.3332 | European XFEL | SPB/SFX |
| Software Name | Purpose | Version |
|---|---|---|
| CrystFEL | data reduction | 0.10.1 |
| Xtrapol8 | refinement | 1.2.0 |
| PHENIX | refinement | 1.20.1_4487 |
| Coot | model building | 0.9.8.7 |
