ELECTRON MICROSCOPY

Sample

Ternary complex of bivalent glue degrader compound 1 bound to BRD4 and DCAF16:DDB1deltaBPB

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details 3.5 uL complex was dispensed onto the grid, allowed to disperse for 10 s, blotted for 3.5 s using blot force 3, then plunged into liquid ethane
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 192014
Reported Resolution (Å) 3.77
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol ?
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type TFS FALCON 4i (4k x 4x)
Electron Dose (electrons/Å2) 12.7
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS GLACIOS
Minimum Defocus (nm) 1700
Maximum Defocus (nm) 3200
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 190000
Calibrated Magnification 190000
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cryoSPARC 4.1.2
IMAGE ACQUISITION EPU 3.0
CTF CORRECTION cryoSPARC 4.1.2
MODEL FITTING PHENIX 1.20.1-4487
INITIAL EULER ASSIGNMENT cryoSPARC 4.1.2
FINAL EULER ASSIGNMENT cryoSPARC 4.2.1
RECONSTRUCTION cryoSPARC ?
MODEL REFINEMENT PHENIX 1.20.1-4487
MODEL REFINEMENT UCSF ChimeraX 1.6.dev202302040126
MODEL REFINEMENT ISOLDE 1.6.dev1
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?