X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 291 14% PEG8000, 100mM Tris-HCL pH 7.5, 200mM MgCl2
Unit Cell:
a: 197.140 Å b: 115.610 Å c: 65.880 Å α: 90.000° β: 94.970° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: ? Solvent Content: ?
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS FREE R-VALUE 1.15 43.38 444064 22204 85.59 0.1414 0.1547 18.41
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.15 49.82 85.6 0.044 ? 13.33 3.5 ? 444109 ? ? 12.55
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.15 1.18 32.6 ? ? 1.01 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.9796 SLS X06SA
Software
Software Name Purpose Version
PHENIX refinement 1.20.1_4487
PHENIX phasing 1.20.1_4487
XDS data reduction VERSION Feb 5, 2021 BUILT=20210323
XSCALE data scaling VERSION Feb 5, 2021 BUILT=20210323