X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 296 2.0 M AmmoniumSulfate 100 mM Sodium acetate
Unit Cell:
a: 76.244 Å b: 76.244 Å c: 212.257 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 3 2 1
Crystal Properties:
Matthew's Coefficient: 1.97 Solvent Content: 37.60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.75 48.27 72899 3646 99.77 0.2023 0.2350 42.68
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 48.27 99.75 ? ? 19.09 19.0 ? 72926 ? ? 32.69
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.75 1.81 ? ? ? 0.98 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.0 SLS X06DA
Software
Software Name Purpose Version
PDB_EXTRACT data extraction 1.19.2_4158
PHENIX refinement 1.19.2_4158
XDS data reduction .
Aimless data scaling .
SHELX phasing .