X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.7 293 0.4 M KNO3, 16% PEG 3350, 0.1M MOPS pH 6.7
Unit Cell:
a: 62.250 Å b: 75.553 Å c: 75.602 Å α: 92.40° β: 109.57° γ: 99.71°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.71 Solvent Content: 54.59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.65 48.72 140036 7209 95.79 0.18056 0.21373 27.033
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 50 95.7 ? ? 7.47 2.9 ? 147290 ? 1 29.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.65 1.75 92.4 ? ? 0.96 2.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID30B 0.9763 ESRF ID30B
Software
Software Name Purpose Version
REFMAC refinement 5.8.0257
XDS data reduction .
XDS data scaling .
PHASER phasing .
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