X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298 0.2 M Sodium acetate trihydrate, 0.1 M Tris/HCl (pH 8.5), 30% Polyethylene glycol 4000
Unit Cell:
a: 43.822 Å b: 77.951 Å c: 99.833 Å α: 82.814° β: 78.341° γ: 75.588°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.67
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.13 24.48 64925 3217 93.31 0.1831 0.2325 39.05
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.13 61.98 93.4 ? ? 10.5 3.6 ? 65034 ? ? 31.74
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.13 2.25 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U1 0.9792 SSRF BL17U1
Software
Software Name Purpose Version
PHENIX refinement 1.13_2998
HKL-3000 data reduction .
HKL-3000 data scaling .
HKL-3000 phasing .
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