X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 BUFFER = 0.1M TRIS (7.8), SALT= NASCN; PRECIPITANT = PEG 6K
Unit Cell:
a: 34.350 Å b: 43.340 Å c: 48.150 Å α: 111.12° β: 105.87° γ: 90.42°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.62 Solvent Content: 24.26
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.12 37.11 77739 4052 85.87 0.19406 0.21097 15.515
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.12 50 85.7 ? 0.037 9.4 1.7 ? 77739 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.12 1.15 ? ? 0.26 ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID30B 0.9763 ESRF ID30B
Software
Software Name Purpose Version
REFMAC refinement 5.8.0189
XDS data reduction .
Aimless data scaling .
PHASER phasing .