X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 298.00 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
ROTATING ANODE | RIGAKU RU200 | ? | ? | ? |
Software Name | Purpose | Version |
---|---|---|
SDMS | data collection | . |
SDMS | data reduction | . |
TNT | refinement | 5-D |
SDMS | data scaling | . |
TNT | phasing | V. 5-D |