8IBN

ELECTRON MICROSCOPY

Sample

Cryo-EM structure of KpFtsZ single filament

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles 551739
Reported Resolution (Å) 3.03
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol ?
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 60
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model JEOL CRYO ARM 300
Minimum Defocus (nm) 500
Maximum Defocus (nm) 2000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model JEOL CRYOSPECPORTER
Nominal Magnification 60000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cryoSPARC 4.1.1
IMAGE ACQUISITION SerialEM 4.0
CTF CORRECTION cryoSPARC 4.1.1
MODEL FITTING UCSF Chimera 1.15
INITIAL EULER ASSIGNMENT cryoSPARC 4.1.1
FINAL EULER ASSIGNMENT cryoSPARC 4.1.1
RECONSTRUCTION cryoSPARC 4.1.1
MODEL REFINEMENT PHENIX 1.19.2
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?