ELECTRON MICROSCOPY

Sample

Complex of TRiC/CCT and PhLP2A

Specimen Preperation
Sample Aggregation State 2D ARRAY
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 359533
Reported Resolution (Å) 3.82
Resolution Method FSC 0.143 CUT-OFF
Other Details Focused refinement map for CCT3 and PhLP2A complex
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type FEI FALCON IV (4k x 4k)
Electron Dose (electrons/Å2) 50
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 1000
Maximum Defocus (nm) 2000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cryoSPARC 3.2.0
CTF CORRECTION cryoSPARC 3.2.0
MODEL FITTING UCSF Chimera 1.15
MODEL REFINEMENT PHENIX 1.19
MODEL REFINEMENT Coot 0.9.6
INITIAL EULER ASSIGNMENT cryoSPARC 3.2.0
FINAL EULER ASSIGNMENT cryoSPARC 3.2.0
CLASSIFICATION cryoSPARC 3.2.0
RECONSTRUCTION cryoSPARC 3.2.0
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
NONE CTF correction was performed for every micrographs