X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 magnesium chloride, PEG 4000
Unit Cell:
a: 143.040 Å b: 160.110 Å c: 335.620 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: F 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.64 Solvent Content: 53.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.00 44.06 128786 6385 99.95 0.1780 0.2107 39.57
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.00 50 99.93 0.06781 ? 24.27 13.3 ? 128804 ? ? 34.56
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 99.98 ? ? 4.30 13.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL02U1 0.9792 SSRF BL02U1
Software
Software Name Purpose Version
PHENIX refinement 1.18.1_3865
XDS data reduction .
XDS data scaling .
MOLREP phasing .