X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 16% w/v PEG 4000, 0.1 M Tris pH 8.5, and 0.2 M lithium sulfate
Unit Cell:
a: 59.065 Å b: 89.865 Å c: 90.080 Å α: 63.570° β: 78.250° γ: 80.350°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.39 Solvent Content: 63.68
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.83 79.80 36160 1637 93.91 0.2306 0.2740 130.24
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.83 79.80 94.0 0.055 ? 12.0 3.7 ? 36200 ? ? 96.52
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.83 2.96 90.9 ? ? 0.9 3.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97918 APS 24-ID-C
Software
Software Name Purpose Version
PHASER phasing .
PHENIX refinement 1.20.1-4487
Aimless data scaling .
MOSFLM data reduction .