X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.9 293 100 mM Bis-trispropane, 200 mM NaF, 17.6% PEG-3350 (2protein 1solution)
Unit Cell:
a: 77.527 Å b: 58.901 Å c: 88.394 Å α: 90.000° β: 109.670° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.6
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.553 47.52 24650 1153 99.77 0.2176 0.2314 60.06
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.553 73.001 99.9 0.1117 ? 10.33 6.09 ? 24680 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 6.927 73.001 99.7 ? ? 24.14 6.00 1300
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 17-ID-2 0.97934 NSLS-II 17-ID-2
Software
Software Name Purpose Version
autoPROC data processing 1.0.5 20210224
Aimless data scaling 0.7.7
TRUNCATE data processing 7.1.018
PHENIX refinement 1.20.1_4487
XDS data reduction Jan 10, 2022
PHASER phasing 1.20.1_4487
ISOLDE refinement 1.4
Coot model building 0.9.6
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