8FB0

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 295 2.56-2.76 M ammonium sulfate, 100 mM Tris-HCl, 1 mM EDTA, pH 7.4 or 9.0
Unit Cell:
a: 90.288 Å b: 90.288 Å c: 45.255 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 6
Crystal Properties:
Matthew's Coefficient: 3.07 Solvent Content: 59.91
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.76 45.26 21037 1057 99.69 0.1648 0.1937 13.75
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.76 45.26 99.8 0.06 ? 34.32 1.1 ? 21044 ? ? 11.64
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.76 1.823 98.32 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.20.1_4487
HKL-3000 data collection .
HKL-3000 data reduction .
HKL-3000 data scaling .
PHASER phasing .