X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 16-18% PEG 3350, 100 MM NA/K TARTRATE, 20 MM TRIS, PH 7.5. CRYO SOLVENT 20% GLYCEROL
Unit Cell:
a: 89.414 Å b: 83.702 Å c: 95.408 Å α: 90.000° β: 105.770° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.67 Solvent Content: 53.88
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.3300 29.7800 50131 2551 90.6400 0.2337 0.2830 34.0620
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.33 29.8 90.8 0.094 0.087 10.29 4.0 ? 52682 ? 0.0 35.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.33 2.41 54.1 ? 0.195 3.35 3.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 0.97934 NSLS X25
Software
Software Name Purpose Version
REFMAC refinement v5.8.0267
DENZO data reduction .
SCALEPACK data scaling v1.97.2
SOLVE phasing .
RESOLVE model building .
Coot model building v0.8.9.2