ISDA

8EW9

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.5	293	Crystals grew from 180 nL 31.4 mg/mL Aim46p Nd62, 20 nL microseeds in 30% PEG 2000, 0.1 M MES buffer, pH 6.0, mixed with 300 nL reservoir solution composed of 18% PEG 2000, 100 mM MES buffer, pH 6.5. Microseeded crystallization plates were set with a Mosquito crystallization robot in a MRC SD2 crystallization plate. Crystals were cryopreserved with reservoir solution supplemented with 30% PEG 2000

Unit Cell:

a: 39.870 Å b: 71.350 Å c: 40.220 Å α: 90.000° β: 95.165° γ: 90.000°

Symmetry:

Space Group: P 1 21 1

Crystal Properties:

Matthew's Coefficient: 2.16 Solvent Content: 42.98

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	2.00	40.06	15152	1521	99.59	0.1736	0.2335	41.56

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.0	40.06	99.61	0.1234	?	11.51	6.8	?	15174	?	?	30.63

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.0	2.072	98.92	?	?	1.36	6.9	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 23-ID-D	1.03321	APS	23-ID-D

Software