ELECTRON MICROSCOPY

Sample

HSP90B dimer in the closed AMPPNP bound state

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 440225
Reported Resolution (Å) 3.1
Resolution Method FSC 0.143 CUT-OFF
Other Details masked FSC resolution
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 1.5
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS KRIOS
Minimum Defocus (nm) 900
Maximum Defocus (nm) 2000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION RELION V3.1.3
MODEL FITTING UCSF Chimera ?
MODEL FITTING NAMD ?
INITIAL EULER ASSIGNMENT RELION 3.1.3
FINAL EULER ASSIGNMENT cisTEM 1.0
CLASSIFICATION cisTEM 1.0
RECONSTRUCTION cisTEM 1.0
MODEL REFINEMENT PHENIX 1.2
MODEL REFINEMENT Coot 0.9.8.1
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
NONE ?