X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 293.15 20% PEG8000, 200 mM Magnesium chloride, 100 mM Tris-HCl pH 8.5
Unit Cell:
a: 84.313 Å b: 84.313 Å c: 41.733 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 3
Crystal Properties:
Matthew's Coefficient: 2.15 Solvent Content: 42.92
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.42 42.16 61030 2034 97.38 0.1645 0.1688 24.62
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.42 42.16 97.4 0.042 ? 18.3 4.4 ? 61036 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.42 1.44 70.7 ? ? 1.0 1.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 1.0 ALS 5.0.1
Software
Software Name Purpose Version
PHENIX refinement 1.19.1_4122
XDS data reduction .
XDS data scaling 0.5.32 (Aimless)
PHENIX phasing .