X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6 277 0.1 M trilithium citrate tetrahydrate, 10% (w/v) PEG 3350, 1 mM DAHP oxime, 30% (v/v) ethylene glycol, 1:1:0.2, then soaked with 8 mM DAHP oxime
Unit Cell:
a: 210.719 Å b: 53.130 Å c: 150.200 Å α: 90.000° β: 115.460° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.40 43.37 58002 5122 91.73 0.1810 0.2161 29.49
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.40 52.48 97.7 0.085 ? 8.9 3.3 ? 58010 ? ? 21.10
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.40 2.47 91.0 ? ? 4.5 2.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 1.1 NSLS X12C
Software
Software Name Purpose Version
PHENIX refinement 1.19.2_4158
MOSFLM data reduction 7.4.0
Aimless data scaling 0.7.7
PHASER phasing 2.8.3