X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293.0 0.001M MgCl2, 0.1M MES pH6.5, 30% PEG4000
Unit Cell:
a: 41.202 Å b: 41.202 Å c: 348.500 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 65 2 2
Crystal Properties:
Matthew's Coefficient: 2.03 Solvent Content: 39.39
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.5000 30.0000 27784 1438 97.6700 0.2418 0.2539 13.7390
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.50 30.0 100.0 0.118 ? 8.1 31.0 ? 30081 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.50 1.55 100.0 ? ? 5.0 30.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 1.00000 ALS 5.0.2
Software
Software Name Purpose Version
BOS data collection v3
DENZO data reduction v2.3.12
HKL-2000 data reduction v721.2
SCALEPACK data scaling v2.3.12
HKL-2000 data scaling v721.2
PHASER phasing v2.5.6
REFMAC refinement v5.8.0073
Coot model building v0.8.9.1
PDB_EXTRACT data extraction 3.27
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