X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.1 298 10% PEG 8000, 8% glycerol, 5 mM B-mercaptoethanol, 100 mM Tris pH 8.1
Unit Cell:
a: 78.544 Å b: 86.305 Å c: 201.199 Å α: 89.790° β: 85.390° γ: 69.490°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.87 Solvent Content: 57.09
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.8500 47.4300 113362 1951 98.4400 0.2341 0.2672 108.6907
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.830 47.430 98.500 0.118 ? 6.100 3.500 ? 115889 ? ? 76.730
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.830 2.880 98.000 ? ? ? 3.300 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.3 1 ALS 5.0.3
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.7.4
PHENIX refinement 1.19
PDB_EXTRACT data extraction 3.27
PHENIX phasing 1.19
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