X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.1 298 10% PEG 8000, 8% glycerol, 5 mM B-mercaptoethanol, 100 mM Tris pH 8.1
Unit Cell:
a: 79.067 Å b: 86.271 Å c: 201.967 Å α: 89.700° β: 86.010° γ: 69.450°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.90 Solvent Content: 57.55
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.0000 47.9800 98169 1850 98.3500 0.2477 0.2755 136.6622
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.930 47.980 98.400 0.114 ? 5.900 3.500 ? 105382 ? ? 90.680
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.930 2.980 98.100 ? ? ? 3.700 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 1 ALS 5.0.1
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.7.4
PHENIX refinement 1.19
PDB_EXTRACT data extraction 3.27
PHENIX phasing 1.19
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