8D0O

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 293 1.6 M Ammonium sulfate, 100 mM Tris pH 8.0
Unit Cell:
a: 127.120 Å b: 127.120 Å c: 127.120 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 21 3
Crystal Properties:
Matthew's Coefficient: 2.4 Solvent Content: 48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 2.1 51.9 19803 1880 98.99 0.1665 0.2088 21.5
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 51.9 99.1 ? ? 42.4 43 ? 19803 ? ? 19.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.1 2.18 88.3 ? ? 6.4 15 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.7 APS 22-ID
Software
Software Name Purpose Version
PHENIX refinement 1.12_2829
XDS data reduction .
XSCALE data scaling .
PHASER phasing .