ELECTRON MICROSCOPY

Sample

haXWnt8-mFzd8CRD-hLRP6E1E2

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details 3 s blotting before plunging
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 82235
Reported Resolution (Å) 3.8
Resolution Method FSC 0.143 CUT-OFF
Other Details Model resolution is substantially lower and estimated to be ~10 angstrom based on the map-model FSC.
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 55
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 1000
Maximum Defocus (nm) 2000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 29000
Calibrated Magnification 58680
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION cryoSPARC 3.3
MODEL REFINEMENT PHENIX ?
INITIAL EULER ASSIGNMENT cryoSPARC 3.3
FINAL EULER ASSIGNMENT cryoSPARC 3.3
CLASSIFICATION cryoSPARC 3.3
RECONSTRUCTION cryoSPARC 3.3
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?