X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 292 10 mM CuSO4 100 mM NaOAc 30% MPD
Unit Cell:
a: 55.450 Å b: 55.450 Å c: 55.520 Å α: 111.47° β: 111.13° γ: 105.80°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.84 Solvent Content: 67.93
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.60 45.77 13913 783 94.02 0.18198 0.26124 48.493
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.60 45.77 94.1 0.137 ? 5.3 2.7 ? 14716 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.74 ? 92.3 ? ? 2.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALBA BEAMLINE XALOC 1.37323 ALBA XALOC
Software
Software Name Purpose Version
REFMAC refinement 5.8.0258
SCALA data scaling .
MOSFLM data reduction .
MOLREP phasing .
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