X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 0.024 M 1,6-Hexanediol, 0.024 M 1-Butanol, 0.024 M 1,2-Propanediol, 0.024 M 2-Propanol 0.024 M 1,3-Propanediol, 0.05 M Sodium HEPES, 0.05 M MOPS, 9.375% v/v MPD; 9.375% PEG 1000; 9.375% w/v PEG 3350
Unit Cell:
a: 42.710 Å b: 42.710 Å c: 65.090 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 31
Crystal Properties:
Matthew's Coefficient: ? Solvent Content: ?
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.6388072348 36.9879449956 16212 810 99.3991416309 0.214110437676 0.257643008052 59.8461060216
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6388072348 36.9879449956 99.4 0.040 ? 23.81 10.44 ? 16212 ? ? 43.4269937054
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.6388072348 1.75 99.5 ? ? 1.46 10.10 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.9786 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
PHENIX refinement 1.11.1_2575
XDS data reduction .
XDS data scaling .
PHASER phasing .
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