X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 4.1 M NaCl, 0.1 M Hepes pH 7.5, 0.1M NaI.
Unit Cell:
a: 187.516 Å b: 209.215 Å c: 195.799 Å α: 90° β: 90° γ: 90°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 4.42 Solvent Content: 72.20
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 3.6 55.37 40205 2006 89.7 0.2541 0.2801 118.23
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.145 113.688 93.7 0.1695 ? 7.00 5.98 ? 44021 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 9.990 113.688 98.3 ? ? 22.79 5.31 2200
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.97857, 1.74013 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
autoPROC data processing 1.0.5 20200918
XDS data reduction Jan 31, 2020
Aimless data scaling 0.7.4
STARANISO data scaling 2.3.46
SHELXCD phasing 2013/2
PHASER phasing 2.8.3
PARROT phasing 1.0.4
BUSTER refinement 2.10.4
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