8CJ2

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 290.15 0.17 M ammonium sulfate 0.085 M NaOAc pH 4.6 25.5% PEG 2000 MME 15% (v/v) glycerol
Unit Cell:
a: 98.67 Å b: 98.67 Å c: 168.56 Å α: 90° β: 90° γ: 120°
Symmetry:
Space Group: P 62
Crystal Properties:
Matthew's Coefficient: 3.07 Solvent Content: 59.95
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.127 24.41 51870 2593 99.7 0.1944 0.2150 57.15
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.127 49.335 99.76 0.107 ? 20.119 21.23 ? 51901 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.127 2.182 96.79 ? ? 2.007 18.79 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.97857 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
BUSTER refinement 2.10.4
MxCuBE data collection .
XDS data reduction .
XDS data scaling .
STARANISO data scaling .
Coot model building .
PHASER phasing .