X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 293 2 M Ammonium sulfate; 0.1 Sodium acetate pH 4.6
Unit Cell:
a: 34.230 Å b: 39.990 Å c: 42.720 Å α: 74.740° β: 78.480° γ: 69.510°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.06 Solvent Content: 40.16
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.20 36.62 58561 2096 92.07 0.1163 0.1409 11.06
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.20 36.62 92.1 ? ? 12.54 3.29 ? 58658 ? ? 7.16
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.20 1.27 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID30B 0.9762 ESRF ID30B
Software
Software Name Purpose Version
PHENIX refinement 1.19.2_4158
MxCuBE data collection 3
XDS data reduction .
XDS data scaling .
Coot model building .
PHASER phasing .
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