ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.8	288.15	0.2 M Potassium bromide, 0.2 M Potassium thiocyanate, 0.1 M Tris pH 7.8, 3 % w/v PGA (Na+ form, LM) 2 % w/v PEG 3350 5 mM Tb-XO4

Unit Cell:

a: 96.062 Å b: 96.062 Å c: 100.350 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 32

Crystal Properties:

Matthew's Coefficient: 2.25 Solvent Content: 45.41

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.3000	24.2700	45797	2001	99.4700	0.1955	0.2446	26.4277

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.100	24.271	99.900	?	0.442	6.400	9.900	?	45797	?	?	17.420

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.100	2.210	100.000	?	1.222	0.600	10.500	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		77 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	ESRF BEAMLINE ID23-1	0.88560	ESRF	ID23-1

Software