X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 293 0.01 M Nickel(II) chloride hexahydrate, 0.1 M Tris, 20% (w/v) PEG 2000MME
Unit Cell:
a: 53.200 Å b: 54.354 Å c: 69.037 Å α: 67.710° β: 77.210° γ: 61.630°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.02 Solvent Content: 59.30
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.60 27.15 66116 3299 79.69 0.1782 0.2068 29.95
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 27.15 94.8 ? ? 4.7 3.5 ? 78791 ? ? 19.46
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.60 1.64 89.0 ? ? 0.33 3.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID30B 0.9762 ESRF ID30B
Software
Software Name Purpose Version
XDS data reduction .
STARANISO data scaling .
PHASER phasing .
PHENIX model building .
PHENIX refinement 1.20.1_4487