8AH4

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.0 298 30% PEG4K, 0.2M AMSO4, 0.1M AcONa
Unit Cell:
a: 61.698 Å b: 61.698 Å c: 228.702 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 31 1 2
Crystal Properties:
Matthew's Coefficient: 1.88 Solvent Content: 34.52
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.4800 48.4100 58980 2882 70.2500 0.1966 0.2308 24.4110
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.478 52.031 93.6 0.071 ? 11.1 4.9 ? 59113 ? ? 16.730
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.478 1.635 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE MASSIF-1 0.9677 ESRF MASSIF-1
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling .
PHASER phasing .
PHENIX refinement 1.20
PDB_EXTRACT data extraction 3.27