X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.3 293 0.9 M ammonium sulfate 10% PEG 8000 MES buffer pH 8.3
Unit Cell:
a: 139.208 Å b: 139.215 Å c: 143.689 Å α: 90.02° β: 90.03° γ: 89.99°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 4.19 Solvent Content: 70.67
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 4.507 47.9 42090 2027 66.2 0.2784 0.2913 200.99
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
4.3 50 92.3 ? ? 7.64 1.68 ? 68007 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 4.3 4.6 93 ? ? 0.44 1.66 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1 SLS X06DA
Software
Software Name Purpose Version
BUSTER refinement 2.10.3
PHENIX refinement 1.20-4459
XDS data scaling .
PHASER phasing .
Coot model building .
PDB-REDO refinement .