X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 1.2-1.6 M (NH4)2SO4, 0.1 M Tris-HCl
Unit Cell:
a: 141.984 Å b: 148.511 Å c: 74.055 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: C 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.71 Solvent Content: 55
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.5000 46.7400 124793 11862 99.9400 0.1877 0.2050 20.7250
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.500 46.740 100.000 0.150 ? 10.600 13.100 ? 124828 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.500 1.530 99.900 ? ? ? 13.300 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 5.2R 1.00 ELETTRA 5.2R
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.7.4
PHASER phasing 2.8.3
PHENIX refinement 1.19rc7-4070
PDB_EXTRACT data extraction 3.27
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