X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 285 1 M Sodium citrate, 67 mM HEPES
Unit Cell:
a: 69.051 Å b: 69.051 Å c: 121.638 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 41 2 2
Crystal Properties:
Matthew's Coefficient: 2.22 Solvent Content: 44.52
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.8000 48.8300 26683 1405 99.6100 0.1860 0.2205 36.4730
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.800 48.830 99.600 0.166 ? 17.620 25.112 ? 28088 ? ? 42.032
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.800 1.910 97.600 ? ? 1.120 21.657 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 2 0.980111 SOLEIL PROXIMA 2
Software
Software Name Purpose Version
XDS data scaling .
REFMAC refinement 5.8.0267
PDB_EXTRACT data extraction 3.27
XDS data reduction .
PHASER phasing .