X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 100 mM HEPES pH 7.5 and 18% w/v PEG 8,000
Unit Cell:
a: 49.852 Å b: 60.662 Å c: 67.074 Å α: 89.950° β: 71.790° γ: 90.010°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.60 Solvent Content: 23.14
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.5100 63.7100 112268 3938 100.0000 0.1644 0.1863 28.6080
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.51 63.710 84.7 ? ? 6.4 1.6 ? 127042 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.51 1.64 51.4 ? ? 1.4 1.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE MASSIF-1 0.966 ESRF MASSIF-1
Software
Software Name Purpose Version
autoPROC data processing .
XDS data reduction .
XDS data scaling .
PHASER phasing .
REFMAC refinement 5.8.0267
PDB_EXTRACT data extraction 3.27