X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.3 291 peg4000, 200 mM KCl
Unit Cell:
a: 81.505 Å b: 85.790 Å c: 101.280 Å α: 102.380° β: 103.410° γ: 94.130°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.79 Solvent Content: 55.9
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.5000 29.9400 78903 3956 88.7000 0.2228 0.2566 71.7085
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 30.000 89.000 0.120 ? 8.200 5.400 ? 78997 ? ? 48.470
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.500 2.590 70.300 ? ? ? 2.900 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U1 0.97928 SSRF BL17U1
Software
Software Name Purpose Version
HKL-2000 data scaling .
PHENIX refinement 1.19.2_4158
PDB_EXTRACT data extraction 3.27
HKL-2000 data reduction .
PHASER phasing .