X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291.15 0.1 M Tris pH8.5, 0.2 M lithium sulfate, 30% (w/v) polyethylene glycol (PEG) 4000
Unit Cell:
a: 53.844 Å b: 58.005 Å c: 87.940 Å α: 90.417° β: 101.602° γ: 91.977°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.78 Solvent Content: 55.74
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.54 34.81 148432 7377 96.29 0.1648 0.1879 13.00
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.54 86.13 96.6 ? ? 5.3 3.4 ? 148952 ? ? 7.68
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.54 1.56 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 193.15 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL18U1 0.9791 SSRF BL18U1
Software
Software Name Purpose Version
PHENIX refinement 1.15.2_3472
HKL-3000 data reduction .
HKL-3000 data scaling .
PHASER phasing .
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