ELECTRON MICROSCOPY

Sample

Repeating unit of langerin lattice in Birbeck granule

Specimen Preperation
Sample Aggregation State 2D ARRAY
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details Blot for 10 seconds before plunging
3D Reconstruction
Reconstruction Method SUBTOMOGRAM AVERAGING
Number of Particles 63563
Reported Resolution (Å) 6.4
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol BACKBONE TRACE
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 1.24
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model TFS KRIOS
Minimum Defocus (nm) 3000
Maximum Defocus (nm) 6000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 35000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
VOLUME SELECTION IMOD 4.11.11
VOLUME SELECTION RELION 4.0
IMAGE ACQUISITION SerialEM 3.8
CTF CORRECTION RELION 4.0
MODEL FITTING UCSF Chimera 1.15
MODEL REFINEMENT PHENIX 1.19.2
FINAL EULER ASSIGNMENT RELION 4.0
CLASSIFICATION RELION 4.0
RECONSTRUCTION RELION 4.0
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?