X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 291 25% PEG 2000MME, 0.1M Bis-Tris pH 6.5, 0.2 M Lithium sulfate
Unit Cell:
a: 72.968 Å b: 96.327 Å c: 47.257 Å α: 90.000° β: 111.060° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.81 Solvent Content: 56.21
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.9300 33.3700 22107 1077 96.1400 0.1672 0.2072 28.9752
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.930 55.600 96.400 0.092 ? 11.800 5.200 ? 22121 ? ? 24.440
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.930 2.030 96.900 ? ? ? 5.300 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U1 0.9792 SSRF BL17U1
Software
Software Name Purpose Version
PHENIX refinement 1.20_4459
Aimless data scaling .
PDB_EXTRACT data extraction 3.27
HKL-2000 data reduction .
PHASER phasing .
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