X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.2 M ammonium acetate, 20% PEG3350
Unit Cell:
a: 58.021 Å b: 66.930 Å c: 95.094 Å α: 93.449° β: 102.107° γ: 100.196°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.07 Solvent Content: 40.69
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.10 47.18 148561 7306 92.91 0.1957 0.2359 32.90
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 47.18 97.6 0.112 ? 4.8 3.5 ? 148561 ? ? 23.29
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.14 96.4 ? ? 1.1 3.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-1A 1.070000 Photon Factory BL-1A
Software
Software Name Purpose Version
PHENIX refinement 1.17.1_3660
XDS data reduction .
pointless data scaling .
PHASER phasing .