X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 0.2M lithium sulfate, 0.1M Bis tris pH 5.5, 25% PEG 3350
Unit Cell:
a: 82.833 Å b: 104.941 Å c: 106.840 Å α: 74.867° β: 72.918° γ: 68.076°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.39 Solvent Content: 48.60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT NONE 2.092 21.558 176474 8824 95.090 ? 0.2278 28.960
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.09 21.56 95.2 ? ? 19.7 2.2 ? 176474 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.18 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSRRC BEAMLINE TPS 05A 1 NSRRC TPS 05A
Software
Software Name Purpose Version
PHENIX refinement 5.8.0267
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .