X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 277 16% PEG3350, 0.1 M HEPES (pH 7.0)
Unit Cell:
a: 43.676 Å b: 89.219 Å c: 91.132 Å α: 114.990° β: 95.330° γ: 92.020°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.05 Solvent Content: 59.64
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.0000 19.9800 78651 3904 94.3700 0.1924 0.2188 48.9303
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 19.980 94.200 0.044 ? 10.720 1.837 ? 78731 ? ? 37.980
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.000 2.120 92.300 ? ? 1.230 1.779 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-1A 1.100000 Photon Factory BL-1A
Software
Software Name Purpose Version
XSCALE data scaling .
PHENIX refinement 1.19_4092
PDB_EXTRACT data extraction 3.27
XDS data reduction .
PHASER phasing .
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