X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 18% (v/v) Tacsimate, pH 5.0 11% (v/v) PEG2000MME
Unit Cell:
a: 71.133 Å b: 71.004 Å c: 104.394 Å α: 105.32° β: 101.99° γ: 95.75°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.21 Solvent Content: 61.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.00 14.97 33326 922 88.27 0.1674 0.2033 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.00 50.00 90.7 0.096 ? 13.9 13.9 ? 33846 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.00 3.11 ? ? ? 2.3 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.97913 SSRF BL17U
Software
Software Name Purpose Version
PHENIX refinement (1.19.2_4158)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing (1.19.2_4158)
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