7V63

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 295 1.8-2.2 M ammonium sulphate in 50 mM sodium acetate at pH 4.5-5.2
Unit Cell:
a: 77.449 Å b: 77.449 Å c: 275.526 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 2 2
Crystal Properties:
Matthew's Coefficient: 3.33 Solvent Content: 63.02
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.9060 47.0370 17518 890 90.1400 0.2409 0.2731 79.3821
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.900 50.000 90.300 0.126 ? 7.600 9.000 ? 17605 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.900 3.000 48.200 ? ? ? 5.300 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.000 APS 22-ID
Software
Software Name Purpose Version
PHENIX refinement 1.14_3260
HKL-2000 data scaling .
PDB_EXTRACT data extraction 3.27
HKL-2000 data reduction .
CRANK phasing .